A temperature chamber capable of long dwell times and wide temperature ranges (-55 to 500 °C) for Electro/Stress Migration, Time Dependent Dielectric Breakdown, and Hot Carrier / Vt Stability Tests.
These chambers can be designed with card cages, card-slots, and access doors to simplify connecting DUT boards and driver boards with ATE test setups. Equipped with a programmable, touch-screen controller, the chambers deliver 1.0°C accuracy.
Benefits:
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