iTS Integrates Temperature Platform with Agilent’s Power Device Analyzer
The integration of a temperature controlled thermal platform with the Agilent B1506A Power Device Analyzer has been introduced by inTEST Thermal Solutions and Agilent. The newly designed hot plate permits automated control of platform temperature, from enclosure ambient to 250 °C, for characterization of power devices such as IGBTs and MOSFETs.
Power devices generate heat, which is why manufacturers mainly test in high temperature environments. Conventional thermal platforms did not fit within the fixture area of the analyzer, giving rise to inTEST Thermal’s design.