High Throughput Burn-in Chamber
A temperature chamber capable of long dwell times and wide temperature ranges (-55 to 500 °C) for Electro/Stress Migration, Time Dependent Dielectric Breakdown, and Hot Carrier / Vt Stability Tests.
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InTest Thermal
Thermal Chamber Over Temperature Protection
How to set the bi-metal fail safe
Watch this video to learn how to set the primary over temperature fail safe on a thermal chamber. The chamber's primary fail safe is a bi-metal switch that protects the chamber from run-away or over temperature conditions. If an over temperature condition occurs, the bi-metal fail safe will trip and shut down the chamber's heating and cooling capabilities. It is factory set at 125 °C and must be adjusted for the chamber to operate at temperatures above 125 °C.
Vacuum Thermal Platform
inTEST Thermal Solutions has designed a thermal cycling plate that integrates directly with a customer’s vacuum bell jar for space and altitude testing of RF modules, microwave components, and high power devices. The wide temperature range and stability of the plate is ideal for both thermal stressing of electronics and long periods of power supply testing.
RF-component-temperature-cycling-TWTs
Temperature Cycling Travelling Wave Tubes (TWTs)
inTEST Thermal Solutions (iTS) has designed a multi-zone thermal plate for hot/cold temperature cycling of microwave signal amplifiers used in satellite data communications. The heart of the amplifier is a travelling wave tube (TWT) and power supply.
ThermoStream Air Filter Replacement Video
How to replace the air filters in a Temptronic ThermoStream® temperature forcing system
Watch this video to learn how to change the air filters on a ThermoStream, mobile temperature forcing system. Order service kit CS158580, FILTER ELEMENT KIT, to perform this procedure. Contact service for more information: service@inTESTthermal.com
How to Improve Throughput in Electronics Testing
Getting the most out of Thermal Chambers and Temperature Test Systems
Watch this video to learn how using a thermal system with temperature ranges beyond commercial and MIL-STD requirements can improve throughput when characterizing, conditioning, or testing electronics. A temperature environment that goes beyond requirements can speed up the transition time of the unit-under-test (UUT) and bring it to the target temperature much faster.
